valutazioni - 2, GPA: 4
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Foto e specifiche Fujitsu MHV2080BH |
Facilità d'uso
• Error data structure Indicates the status register when an error occurs. • Total number of drive errors Indicates total number of errors registered in the error log. • Checksum Two's complement of the lower byte, obtained by adding 511-byte data one byte at a time from the beginning. • Status Bits 0 to 3: Indicates the drive status when received error commands according to the following table. Bits 4 to 7: Vendor unique Status Meaning 0 Unclear status 1 Sleep status 2 Standby status 3 Active status (BSY bit = 0) 4 Off-line data collection being executed 5 to F Reserved 5-64 C141-E224 5.3 Host Commands Table 5.20 Data format of SMART Comprehensive Error Log Byte First sector Next sector 00 SMART Error Logging 01h Reserved 01 Index Pointer Latest Error Data Structure Reserved 02…5B 1st Error Log Data Structure Error Log Data Structure 5n+1 5C…B5 2nd Error Log Data Structure2 Error Log Data Structure 5n+2 B6…10F 3rd Error Log Data Structure3 Error Log Data Structure 5n+3 110…169 4th Error Log Data Structure4 Error Log Data Structure 5n+4 16A…1C3 5thError Log Data Structure5 Error Log Data Structure 5n+5 1C4…1C5 Total number of drive errors Reserved 1C6…1FE Reserved Reserved 1FF Check sum Check sum “n” indicates sector number in the Error Log. The first sector is 0. • SMART Self-Test The host computer can issue the SMART Execute Off-line Immediate sub- command (Features field = D4h) and cause the device to execute a self-test. When the self-test is completed, the device saves the SMART self-test log to the disk medium. The host computer can issue the SMART Read Log Sector sub-command (Features field = D5h, Sector Number field = 06h, Sector Count field = 01h) and can read the SMART self-test log. C141-E224 5-65 Interface Table 5.21 SMART self-test log data format Byte Item 00, 01 Self-test log data structure 02 Self-test log 1 Self-test number (Sector Number field Value) 03 Self-test execution status 04, 05 Life time. Total power-on time [hours] 06 Self-test error No. 07 to 0A Error LBA 0B to 19 Vendor unique 1A to 1F9 Self-test log 2 to 21 (Each log data format is the same as that in byte 02 to 19.) 1FA, 1FB Vendor unique 1FC Self-test index 1FD, 1FE Reserved 1FF Check sum • Self-test number Indicates the type of self-test executed. • Self-test execution status Same as byte 16Bh of the attribute value. • Self-test index If this is "00h", it indicates the status where the self-test has never been executed. • Checksum Two's complement of the lower byte, obtained by adding 511-byte data one byte at a time from the beginning. 5-66 C141-E224 5.3 Host Commands Table 5.22 Selective self-test log data structure Byte Item 00h, 01h Data Structure Revision Number 02h...09h Test Span 1 Starting LBA 0Ah...11h Ending LBA 12h...19h Test Span 2 Starting LBA 1Ah...21h Ending LBA 22h...29h Test Span 3 Starting LBA 2Ah...31h Ending LBA 32h...39h Test Span 4 Starting LBA 3Ah...41h Ending LBA 42h...49h Test Span 5 Starting LBA 4Ah...51h Ending LBA 52h...151h Reserved 152h...1EBh Vender Unique 1Ech...1F3h Current LBA under test 1F4h...1F5h Current Span under test 1F6h...1F7h Feature Flags 1F8h Vender Unique Offline Execution Flag 1F9h Selective Offline Scan Number 1FAh, 1FBh Reserved 1FCh, 1FDh Selective Self-test pending time [min] 1FEh, 1FFh Checksum • Test Span Selective self-test log provides for the definition of up to five test spans. If the starting and ending LBA values for a test span are both zero, a test span is not defined and not tested. • Current LBA under test As the self-test progress, the device shall modify this value to contain the LBA currently being tested. C141-E224 5-67 Interface • Current Span under test As the self-test progress, the device shall modify this value to contain the test span number currently being tested. • Feature Flags Table 5.23 Selective self-test feature flags Bit Description 0 Vendor specific (unused) 1 When set to one, perform off-line scan after selective test 2 Vendor specific (unused) 3 When set to one, off-line scan after selective test is pending. 4 When set to one, off-line scan after selective test is active. 5...15 Reserved Bit [l] shall be written by the host and returned unmodified by the device. Bit [3:4] shall be written as zeros by the host and the device shall modify them as the test progress. • Selective Self-test pending time [min] The selective self-test pending time is the time in minutes from power-on to the resumption of the off-line testing if the pending bit is set. 5-68 C141-E224 5.3 Host Commands (17) DEVICE CONFIGURATION (X'B1') Individual Device Configuration Overlay feature sub commands are identified by the value placed in the Features field. The following table shows these Features field values. If this command sets with the reserved value of Features field, an aborted command error is posted. FR field Command C0h DEVICE CONFIGURATION RESTORE C1h DEVICE CONFIGURATION FREEZE C2h DEVICE CONFIGURATION IDENTIFY C3h DEVICE CONFIGURATION SET 00h-BFh, C4h-FFh Rese...
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